Title :
Elimination of false aggressors using the functional relationship for full-chip crosstalk analysis
Author :
Yang, Jae-Seok ; Kim, Jeong-Yeol ; Choi, Joon-Ho ; Yoo, Moon-Hyun ; Kong, Jeong-Taek
Author_Institution :
Dept. of Device Solution Network, Samsung Electron., South Korea
Abstract :
As the portion of coupling capacitance increases in smaller process geometries, accurate coupled noise analysis is becoming more important in current design methodologies. We propose a method to determine whether aggressors can potentially switch simultaneously with the victim or not. The functional information is used to classify the aggressors. Our functional pruning algorithm inspects the conflict of the net states using CNF (conjunction normal form) and BDD (binary decision diagram). We present the experimental results on several industrial circuits. In the experiments, 6.4% of total aggressors are false and the accuracy of delay calculation can be improved up to 36.6%.
Keywords :
binary decision diagrams; crosstalk; delay estimation; integrated circuit noise; logic design; accurate coupled noise analysis; binary decision diagram; conjunction normal form; coupling capacitance; current design methodology; delay calculation; false aggressors; full chip crosstalk analysis; functional pruning algorithm; industrial circuits; net states; process geometry; Accuracy; Binary decision diagrams; Boolean functions; Capacitance; Circuits; Crosstalk; Data structures; Design methodology; Geometry; Switches;
Conference_Titel :
Quality Electronic Design, 2003. Proceedings. Fourth International Symposium on
Print_ISBN :
0-7695-1881-8
DOI :
10.1109/ISQED.2003.1194756