Title :
High-Intensity Radiated Field fault-injection experiment for a fault-tolerant distributed communication system
Author :
Yates, Amy M. ; Torres-Pomales, Wilfredo ; Malekpour, Mahyar R. ; González, Oscar R. ; Gray, W. Steven
Author_Institution :
Nat. Aeronaut. & Space Adm., Hampton, VA, USA
Abstract :
Safety-critical distributed flight control systems require robustness in the presence of faults. In general, these systems consist of a number of input/output (I/O) and computation nodes interacting through a fault-tolerant data communication system. The communication system transfers sensor data and control commands and can handle most faults under typical operating conditions. However, the performance of the closed-loop system can be adversely affected as a result of operating in harsh environments. In particular, High-Intensity Radiated Field (HIRF) environments have the potential to cause random fault manifestations in individual avionic components and to generate simultaneous system-wide communication faults that overwhelm existing fault management mechanisms. This paper presents the design of an experiment conducted at the NASA Langley Research Center´s HIRF Laboratory to statistically characterize the faults that a HIRF environment can trigger on a single node of a distributed flight control system.
Keywords :
aircraft communication; aircraft control; closed loop systems; data communication; distributed control; fault tolerance; NASA Langley Research Center HIRF Laboratory; avionic component; fault manifestation; fault tolerant data communication system; fault tolerant distributed communication system; high intensity radiated field fault injection experiment; safety critical distributed flight control system; system wide communication fault management mechanisms; Aerospace control; Communication systems; Control systems; Fault tolerance; Fault tolerant systems; Monitoring; Software;
Conference_Titel :
Digital Avionics Systems Conference (DASC), 2010 IEEE/AIAA 29th
Conference_Location :
Salt Lake City, UT
Print_ISBN :
978-1-4244-6616-0
DOI :
10.1109/DASC.2010.5655331