• DocumentCode
    3395070
  • Title

    Effect of nanometer inorganic particles on DC breakdown characteristics of Al2O3/PI films

  • Author

    Bu, Wenbin ; Yin, Jinghua ; Song, Yilei ; Liu, Xiaoxu ; Yuan, Pengliang ; Yong Fan

  • Author_Institution
    Key Lab. of Eng. Dielectric & Its Applic., Harbin Univ. of Sci. & Technol., Harbin, China
  • fYear
    2009
  • fDate
    19-23 July 2009
  • Firstpage
    820
  • Lastpage
    822
  • Abstract
    In order to investigate the roles of inorganic nanoparticles on improving breakdown behavior of Al2O3/PI film, the DC breakdown characteristics were studied in this paper. The morphology and element distribution of zones near the breakdown holes were observed by SEM and electron spectroscope for both the original PI film and Al2O3/PI nanocomposite film. The experimental results showed that the electrical breakdown strength was enhanced significantly for the sample with 5% Al2O3 content. The damaged region of breakdown hole for PI is larger than that of Al2O3/PI nanocomposite and PI film were much more seriously destroyed. There are larger distinctness for the distribution of C and O elements in zones near breakdown holes for both PI and Al2O3/PI nanocomposite films.
  • Keywords
    aluminium compounds; dielectric materials; electric breakdown; nanocomposites; polymer insulators; Al2O3; DC breakdown; element distribution; inorganic nanoparticles; morphology; nanocomposite films; nanometer inorganic particle; Dielectric breakdown; Dielectric materials; Dielectrics and electrical insulation; Electric breakdown; Electrodes; Morphology; Nanoparticles; Polymer films; Pulse width modulation; Pulse width modulation converters; Al2O3/PI composite films; DC; breakdown hole morphology; electric breakdown;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Properties and Applications of Dielectric Materials, 2009. ICPADM 2009. IEEE 9th International Conference on the
  • Conference_Location
    Harbin
  • Print_ISBN
    978-1-4244-4367-3
  • Electronic_ISBN
    978-1-4244-4368-0
  • Type

    conf

  • DOI
    10.1109/ICPADM.2009.5252187
  • Filename
    5252187