Title :
Demonstrating robust high data rate capability on a software defined radio using anti-jam wideband OFDM waveforms
Author :
Kleider, John E. ; Gifford, Steve ; Nolan, Keith ; Hughes, Derrick ; Chuprun, Scott
Author_Institution :
Gen. Dynamics C4 Syst., Atlanta, GA
Abstract :
This paper describes the partitioning and performance features of a tactical wideband waveform capability for software defined radio. Current Navy SDR product development efforts are being completed that provide legacy waveform and cryptographic algorithms supporting line of site (LOS), beyond-LOS (BLOS), and Saicom operational modes. Using existing RF and analog/digital conversion modules with the insertion of a new wideband COTS modem, the SDR test-bed is demonstrated to provide wideband high data rate capability. The tactical wideband wireless network (TWWiN) waveform provides a data rate greater than 2 Mbit/sec and is capable of achieving robust operation with frequency selective fading in time varying mobile channels. The modulation achieves high performance using coherent modulation and demodulation through the use of robust acquisition, synchronization, and channel estimation. The waveform is structured to provide spectrally efficient transmission and has a growth path to frequency hopping operation
Keywords :
OFDM modulation; analogue-digital conversion; broadband networks; channel estimation; demodulation; fading channels; military communication; mobile radio; software radio; synchronisation; time-varying channels; SDR; analog-digital conversion modules; anti-jam wideband OFDM waveforms; channel estimation; coherent modulation; demodulation; frequency hopping operation; frequency selective fading; robust acquisition; software defined radio; synchronization; tactical wideband waveform; tactical wideband wireless network; time varying mobile channels; Cryptography; Modems; OFDM; Partitioning algorithms; Product development; Radio frequency; Robustness; Software radio; Testing; Wideband;
Conference_Titel :
Military Communications Conference, 2005. MILCOM 2005. IEEE
Conference_Location :
Atlantic City, NJ
Print_ISBN :
0-7803-9393-7
DOI :
10.1109/MILCOM.2005.1605911