• DocumentCode
    3395352
  • Title

    Nanoclay-filled epoxy composites for electrical insulation applications

  • Author

    Morales, A. Guevara ; Taylor, A.C. ; Fu, M. ; Hyde, A. ; Perrot, F.

  • Author_Institution
    Dept. of Mech. Eng., Imperial Coll. London, London, UK
  • fYear
    2009
  • fDate
    19-23 July 2009
  • Firstpage
    868
  • Lastpage
    871
  • Abstract
    Bulk samples of epoxy were modified with organically-modified nanoclays. The morphology of the modified materials has been characterised using microscopy and X-ray diffraction techniques, and found to be intercalated. Improvements in tensile and fracture properties were found. The toughening mechanisms were crack deflection and plastic deformation of the epoxy. The permittivity and loss angle of the nanocomposites decreased and their breakdown strength was increased as desired for insulation applications. The electrical damage zone was analysed with different microscopy techniques.
  • Keywords
    X-ray diffraction; clay; cracks; electric breakdown; epoxy insulation; fracture; microscopy; nanostructured materials; permittivity; plastic deformation; X-ray diffraction techniques; breakdown strength; crack deflection; electrical damage zone; electrical insulation; fracture properties; materials morphology; microscopy; nanoclay-filled epoxy composites; nanocomposites; organically-modified nanoclays; plastic deformation; tensile properties; toughening mechanisms; Dielectrics and electrical insulation; Electric breakdown; Glass; Mechanical factors; Nanocomposites; Nanoparticles; Permittivity; Power transformer insulation; Testing; X-ray diffraction; Epoxy; breakdown; microstructure; nanoclay; nanocomposite; permittivity; toughness;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Properties and Applications of Dielectric Materials, 2009. ICPADM 2009. IEEE 9th International Conference on the
  • Conference_Location
    Harbin
  • Print_ISBN
    978-1-4244-4367-3
  • Electronic_ISBN
    978-1-4244-4368-0
  • Type

    conf

  • DOI
    10.1109/ICPADM.2009.5252226
  • Filename
    5252226