• DocumentCode
    3395369
  • Title

    Effects of inorganic components on aggregate structure of the PI/SiO2 hybrid film

  • Author

    Wang, Jihua ; Zhang, Mingyan ; Tian, Feng ; Wu, Zijian

  • Author_Institution
    Key Lab. of Eng. Dielectric & Its Applic., Harbin Univ. of Sci. & Technol., Harbin, China
  • fYear
    2009
  • fDate
    19-23 July 2009
  • Firstpage
    872
  • Lastpage
    874
  • Abstract
    In this paper, polyimide/SiO2 (PI/SiO2) hybrid films were prepared via the Sol-Gel process and thermal imidization by the hydrolysis and condensation of triethoxysilane (TEOS), methyl-triethoxysilane (MTEOS) and dimethyldiethoxylsilane (DDS) served as inorganic precursor respectively. The coupling agent used in these hybrid films is 3-amionpropyltriethoxysilane (APrTEOS). The microstructure of hybrid films was characterized by scanning electron microscope (SEM) and atomic force Microscope (AFM) respectively. The result shows that in the PI/TEOS-SiO2 hybrid film, the inorganic particles in nano size were isolated when the silica content was 5 wt%. While for the PI/MTEOS-SiO2 hybrid system, there were a few holes in the organic matrix and the silica particles is in the shape of oval-like and the particles produced agglomerating with the increasing of inorganic component. The quantity of holes was increased on the surface of the PI/DDS-SiO2 hybrid system films. The inorganic particles were in the shape of sphere and generated agglomeration. So DDS is often used with other inorganic precursor.
  • Keywords
    atomic force microscopy; condensation; nanoparticles; organic-inorganic hybrid materials; polymer films; scanning electron microscopy; sol-gel processing; 3-amionpropyltriethoxysilane; AFM; SEM; agglomeration; aggregate structure; atomic force microscope; condensation; dimethyldiethoxylsilane; hydrolysis; inorganic components; methyl-triethoxysilane; polyimide/silicon dioxide hybrid films; scanning electron microscope; sol-gel process; thermal imidization; triethoxysilane; Aggregates; Atomic force microscopy; Composite materials; Dielectric materials; Glass; Materials science and technology; Polyimides; Scanning electron microscopy; Shape; Silicon compounds; Hybrid films; inorganic precursor; polyimide;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Properties and Applications of Dielectric Materials, 2009. ICPADM 2009. IEEE 9th International Conference on the
  • Conference_Location
    Harbin
  • Print_ISBN
    978-1-4244-4367-3
  • Electronic_ISBN
    978-1-4244-4368-0
  • Type

    conf

  • DOI
    10.1109/ICPADM.2009.5252229
  • Filename
    5252229