• DocumentCode
    3395473
  • Title

    Designs of signal-ground bump-patterns for minimizing the simultaneous switching noise in a ball grid array

  • Author

    Sun, Ruey-Bo ; Lin, Chien-Min ; Wu, Ruey-Beei

  • Author_Institution
    Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei
  • fYear
    2008
  • fDate
    27-29 Oct. 2008
  • Firstpage
    15
  • Lastpage
    18
  • Abstract
    This paper proposes a design methodology to achieve the signal-ground bump-patterns with the minimized simultaneous switching noise (SSN) in a ball grid array (BGA) through the bump assignment optimization. By a simplified scheme for the equivalent model, the full-transistor circuits along with the transmission lines through the chip-packaging interconnect are constructed and validated. With the Genetic Algorithm, the optimization of bump patterns can be thus determined to achieve the minimal inductive effects in the improved suppression of SSN for a large-scale BGA demonstration.
  • Keywords
    ball grid arrays; genetic algorithms; transmission lines; ball grid array; bump assignment optimization; chip-packaging interconnection; full-transistor circuits; genetic algorithm; large-scale BGA demonstration; minimal inductive effects; signal-ground bump-patterns; simultaneous switching noise minimazation; transmission lines; Circuit noise; Communication switching; Computational modeling; Distributed parameter circuits; Electronics packaging; Equivalent circuits; Genetic algorithms; Inductance; Power transmission lines; Signal design;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Performance of Electronic Packaging, 2008 IEEE-EPEP
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    978-1-4244-2873-1
  • Type

    conf

  • DOI
    10.1109/EPEP.2008.4675864
  • Filename
    4675864