DocumentCode
3395473
Title
Designs of signal-ground bump-patterns for minimizing the simultaneous switching noise in a ball grid array
Author
Sun, Ruey-Bo ; Lin, Chien-Min ; Wu, Ruey-Beei
Author_Institution
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei
fYear
2008
fDate
27-29 Oct. 2008
Firstpage
15
Lastpage
18
Abstract
This paper proposes a design methodology to achieve the signal-ground bump-patterns with the minimized simultaneous switching noise (SSN) in a ball grid array (BGA) through the bump assignment optimization. By a simplified scheme for the equivalent model, the full-transistor circuits along with the transmission lines through the chip-packaging interconnect are constructed and validated. With the Genetic Algorithm, the optimization of bump patterns can be thus determined to achieve the minimal inductive effects in the improved suppression of SSN for a large-scale BGA demonstration.
Keywords
ball grid arrays; genetic algorithms; transmission lines; ball grid array; bump assignment optimization; chip-packaging interconnection; full-transistor circuits; genetic algorithm; large-scale BGA demonstration; minimal inductive effects; signal-ground bump-patterns; simultaneous switching noise minimazation; transmission lines; Circuit noise; Communication switching; Computational modeling; Distributed parameter circuits; Electronics packaging; Equivalent circuits; Genetic algorithms; Inductance; Power transmission lines; Signal design;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Performance of Electronic Packaging, 2008 IEEE-EPEP
Conference_Location
San Jose, CA
Print_ISBN
978-1-4244-2873-1
Type
conf
DOI
10.1109/EPEP.2008.4675864
Filename
4675864
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