Title :
The charge carrier trap energy levels of two different polyimide films characterized by three methods
Author :
Zhang, Peihong ; Wang, Xuan ; Yang, Chun ; Lei, Qingquan
Author_Institution :
Key Lab. of Eng. Dielectric & Its Applic., Harbin Univ. of Sci. & Technol., Harbin, China
Abstract :
The charge carrier trap energy level is an important parameter that will affect the electrical and optical properties of insulating and semiconducting materials. Depending on the characterizing methods, it has a remarkable difference. The trap energy levels of two kinds of polyimide films, original (100 HN) and corona-resistant (100 CR) ones produced by Dupont, are estimated by depolarization current, space charge limited current and thermally stimulated current method. The corresponding values are 1.185 eV-1.200 eV and 1.168 eV-1.220 eV, 0.93 eV and 0.76 eV, 0.65-0.91 eV and 0.60-0.90 eV, respectively. These results show that the trap energy level of polymers comes significantly under the influence of heating procedures, and the shallower traps are constructed in corona-resistant polyimide film.
Keywords :
energy states; polymer films; space charge; charge carrier trap energy levels; depolarization current; insulating materials; polyimide films; semiconducting materials; space charge limited current; thermally stimulated current method; Charge carrier processes; Charge carriers; Dielectrics and electrical insulation; Energy states; Optical films; Polyimides; Polymer films; Semiconductivity; Semiconductor films; Stimulated emission;
Conference_Titel :
Properties and Applications of Dielectric Materials, 2009. ICPADM 2009. IEEE 9th International Conference on the
Conference_Location :
Harbin
Print_ISBN :
978-1-4244-4367-3
Electronic_ISBN :
978-1-4244-4368-0
DOI :
10.1109/ICPADM.2009.5252239
