• DocumentCode
    3395640
  • Title

    A practical method for failure analysis using incomplete warranty data

  • Author

    Mohan, Karen ; Cline, Brad ; Akers, Jennifer

  • Author_Institution
    Relex Software Corp., Greensburg, PA
  • fYear
    2008
  • fDate
    28-31 Jan. 2008
  • Firstpage
    193
  • Lastpage
    199
  • Abstract
    The use of warranty claims data to determine the failure characteristics of a product is well documented. Typically, the failure distribution and its parameters are determined using product manufacturing data for each month of production and the corresponding monthly failure counts derived from the warranty claims. If the data is collected systematically, the product ages at the times of failure can be derived. Classical methods are then used to determine the failure time distribution and parameters. However, our experience shows that, in many cases, it may not be possible to know the failure ages of components. The information available each month might be limited to the volume of shipments and total claims or product returns. In such cases, the data hides the component age at the time of failure. In this paper, we show that when the failure history information is incomplete, the failure distribution of the product can be determined using Bayesian analysis techniques applicable for handling incomplete data. We apply the popular Expectation-Maximization (EM) algorithm to find the Maximum Likelihood Estimates (MLE) of the failure distribution parameters using incomplete data. The effectiveness of the EM algorithm is compared using several sets of incomplete warranty data generated using simulation. We observed that the EM algorithm is powerful in capturing the hidden failure patterns from the incomplete warranty data.
  • Keywords
    Bayes methods; expectation-maximisation algorithm; failure analysis; Bayesian analysis techniques; expectation-maximization algorithm; failure analysis; failure distribution parameters; failure time distribution; incomplete warranty data; maximum likelihood estimation; product failure characteristics; product manufacturing data; Bayesian methods; Costs; Data analysis; Failure analysis; History; Manufacturing; Marketing and sales; Maximum likelihood estimation; Production; Warranties; Expectation-Maximization (EM) algorithm; incomplete data; sales volume; warranty claims;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium, 2008. RAMS 2008. Annual
  • Conference_Location
    Las Vegas, NV
  • ISSN
    0149-144X
  • Print_ISBN
    978-1-4244-1460-4
  • Electronic_ISBN
    0149-144X
  • Type

    conf

  • DOI
    10.1109/RAMS.2008.4925794
  • Filename
    4925794