• DocumentCode
    3395728
  • Title

    Determination of the applicability of using modal analysis for the prediction of voltage stability

  • Author

    Sharma, Chandrabhan ; Ganness, Marcus G.

  • fYear
    2008
  • fDate
    21-24 April 2008
  • Firstpage
    1
  • Lastpage
    7
  • Abstract
    The development and use of accurate methods to predict incipient voltage instability is crucial in preventing such voltage collapse situations. A comparison of the common steady-state methods for voltage stability analysis was undertaken, along with a brief examination into the dynamic approach. Special attention is given to modal analysis technique which provides both a relative proximity of the system to instability, as well identifies the key contributing factors to instability. A PC-based MATLAB prototype application was developed to assist power system operators in the assessment and analysis of the voltage stability of a power network, at any given operating point. Using modal analysis technique, useful features such as power flow analysis and traditional V-P/V-Q analysis have been incorporated. Using the IEEE 30 bus system, the modal analysis technique was shown to provide an accurate estimate of the system´s proximity to the voltage stability limit, and to consistently and correctly predict the critical buses and the weakest branches in the transmission system.
  • Keywords
    modal analysis; power system stability; IEEE 30 bus system; modal analysis; power network; power system operators; steady-state methods; voltage collapse; voltage stability prediction; Load flow analysis; MATLAB; Modal analysis; Power system analysis computing; Power system dynamics; Power system stability; Prototypes; Stability analysis; Steady-state; Voltage; Q-V curve; modal analysis; steady state voltage stability analysis; voltage collapse; voltage instability; voltage stability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Transmission and Distribution Conference and Exposition, 2008. T&D. IEEE/PES
  • Conference_Location
    Chicago, IL
  • Print_ISBN
    978-1-4244-1903-6
  • Electronic_ISBN
    978-1-4244-1904-3
  • Type

    conf

  • DOI
    10.1109/TDC.2008.4517033
  • Filename
    4517033