Title :
Capacity benefit margin assessment based on multi-area reliability exponential analytic model
Author :
Sun, Rong-fu ; Chen, Lin ; Song, Yong-hua ; Sun, Yuan-Zhang
Author_Institution :
Dept. of Electr. Eng., Tsinghua Univ., Beijing
Abstract :
In the environment of the power market, available transfer capability (ATC) is a measure of transfer capability as the technical and commercial indices. In order to meet the requirement of generation reliability by obtaining the support from interconnected areas, the reserve transfer capability of the transmission lines is defined as capacity benefit margin (CBM). At present, CBM is evaluated and optimized through reliability calculation iteration. Based on the generation reliability exponential analytic model of interconnected areas, according to the influence of generation installed capacity (or tie line transmission capacity) and reserve clearing prices, this paper establishes three models and uses the sequential quadratic programming (SQP) to solve the CBM of transmission lines with respect to variable reliability levels. Due to the analytic model, reliability is calculated one time, need no iteration and the coupling influence between areas is taken into account, the optimal results can be fast computed. Test results on TH - RTS show that this method is precise and effective.
Keywords :
iterative methods; power generation reliability; power system interconnection; power transmission lines; quadratic programming; available transfer capability; capacity benefit margin assessment; generation reliability; interconnected areas; multiarea reliability exponential analytic model; reliability calculation iteration; sequential quadratic programming; transmission lines; Couplings; Helium; Power markets; Power measurement; Power system reliability; Power transmission lines; Quadratic programming; Sun; Testing; Transmission line measurements; Available transfer capability; CBM; Multi-area generation reliability; SQP;
Conference_Titel :
Transmission and Distribution Conference and Exposition, 2008. T&D. IEEE/PES
Conference_Location :
Chicago, IL
Print_ISBN :
978-1-4244-1903-6
Electronic_ISBN :
978-1-4244-1904-3
DOI :
10.1109/TDC.2008.4517035