Title :
Numerical analysis of space charge electric field and its effect on TSDC measurement in thin polymer films
Author :
Bu, Wenbin ; Yin, Jinghua ; Tian, Fuqiang ; Lei, Qingquan
Author_Institution :
Sch. of Appl. Sci., Harbin Univ. of Sci. & Technol., Harbin, China
Abstract :
The internal electric field and potential in thin polymer film caused by injected charges were numerically analyzed and some paradoxical TSDC experimental results and the effect of internal electric field on the trap parameters obtained from TSDC measurement were discussed. It´s found that, under short-circuit of the external electrodes, one zero electrical field plane and one potential peak appeared within the film and their positions depended on the spatial distribution of the space charges. The internal electric filed can vary from -3 times 107V/m to 5 times 107V/m in the case of a space charge density 100 C/m3 at the interface between cathode and polymer film. The large internal electric field has an important impact on the space charge transportation due to Poole-Frenkel effect, which can change the trap depth. In addition, the reversed current peak in TSDC spectrum, the reduced space charge quantity that can be measured by TSDC may all be resulted from the internal electric field and potential distribution.
Keywords :
Poole-Frenkel effect; cathodes; dielectric thin films; polymer films; space charge; Poole-Frenkel effect; cathode; charge injection; internal electric field; numerical analysis; potential distribution; space charge density; space charge electric field; space charge transportation; thin polymer film; trap depth; Cathodes; Cause effect analysis; Charge measurement; Current measurement; Electric potential; Electric variables measurement; Electrodes; Numerical analysis; Polymer films; Space charge; internal electric field; internal electric potential; space charge; thermally stimulated current; transportation;
Conference_Titel :
Properties and Applications of Dielectric Materials, 2009. ICPADM 2009. IEEE 9th International Conference on the
Conference_Location :
Harbin
Print_ISBN :
978-1-4244-4367-3
Electronic_ISBN :
978-1-4244-4368-0
DOI :
10.1109/ICPADM.2009.5252251