DocumentCode :
3395859
Title :
Correlation of PDN impedance with jitter and voltage margin for high speed channels
Author :
Laddha, Vishal ; Swaminathan, Madhavan
Author_Institution :
Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA
fYear :
2008
fDate :
27-29 Oct. 2008
Firstpage :
73
Lastpage :
76
Abstract :
Timing margin (jitter) and voltage margin (noise) are the main bottlenecks in the performance of high speed digital channels. The simultaneous switching noise (SSN) induced by the return path discontinuities such as signal via transitions and plane cutouts is a major source of jitter and noise introduced by the package and the printed circuit boards on the signal interconnects of these channels. In this paper, we present a new methodology to correlate SSN induced signal jitter and noise with the power distribution network (PDN) impedance by studying the exact mechanism of how the PDN impedance affects signal jitter and voltage margin. Further, we validate the analysis by both simulations and measurements and suggest design practices to reduce jitter and noise on the signal.
Keywords :
circuit noise; electronics packaging; printed circuits; timing jitter; high speed digital channels; power distribution network impedance; printed circuit boards; return path discontinuities; signal interconnects; signal via transitions; simultaneous switching noise; timing margin; voltage margin; Circuit noise; Impedance; Integrated circuit interconnections; Packaging; Power systems; Printed circuits; Signal analysis; Switching circuits; Timing jitter; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Performance of Electronic Packaging, 2008 IEEE-EPEP
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4244-2873-1
Type :
conf
DOI :
10.1109/EPEP.2008.4675880
Filename :
4675880
Link To Document :
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