Title :
Accurate resistance, inductance, capacitance, and conductance (RLCG) from uniform transmission line measurements
Author :
Degerstrom, M.J. ; Gilbert, B.K. ; Daniel, E.S.
Author_Institution :
Mayo Clinic Special Purpose Processor Dev. Group (SPPDG), Rochester, MN
Abstract :
Existing time-based and frequency-based RLCG extraction methods from measurements on uniform transmission lines are discussed. Using a THRU bisect de-embedding technique proved useful in removing resonances, particularly with the distributed resistance.
Keywords :
broadband networks; capacitance; electric admittance; electric resistance; inductance; transmission lines; THRU bisect deembedding technique; distributed resistance; frequency-based RLCG extraction; time-based RLCG extraction; uniform transmission line measurements; Capacitance measurement; Dielectric losses; Dielectric measurements; Electrical resistance measurement; Equations; Frequency measurement; Inductance measurement; Scattering parameters; Transmission line measurements; Transmission lines;
Conference_Titel :
Electrical Performance of Electronic Packaging, 2008 IEEE-EPEP
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4244-2873-1
DOI :
10.1109/EPEP.2008.4675881
