Title :
System level BIT: a tool for MATE test station self maintenance
Author :
Seeger, Joseph M.
Author_Institution :
AAI Corp., Hunt Valley, MD, USA
Abstract :
The author examines what can be done in a MATE environment to reduce self-test runtime and at the same time provide increased fault detection and isolation. His solution involves the integration of VMEbus extension for instrumentation (VXI bus) technology and existing BIT (built-in-test) techniques. This integration produces a system-level BIT capable of utilizing integrated test station resources to keep the BIT hardware/firmware overhead to a minimum. In addition, data collected during system level BIT can be used to compensate for instrument drift and path loss, reducing the frequency of routine calibration and alignment of test station instruments
Keywords :
automatic test equipment; computer interfaces; electronic equipment testing; fault location; MATE test station; VMEbus; VXI bus; fault detection; instrument drift; modular automatic test equipment; path loss; self-test runtime; system-level BIT; Automatic testing; Built-in self-test; Fault detection; Frequency; Hardware; Instruments; Isolation technology; Microprogramming; Runtime environment; System testing;
Conference_Titel :
AUTOTESTCON '89. IEEE Automatic Testing Conference. The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.
Conference_Location :
Philadelphia, PA
DOI :
10.1109/AUTEST.1989.81132
