Accurate parasitic inductance determination of a ceramic capacitor through 2-port measurements

Series and shunt measurement configurations for accurate determination of parasitic inductance of a ceramic capacitor are proposed. With the proposed measurement, longitudinal partial inductance along the capacitor is selectively extracted. Inductances perpendicular to the capacitor are carefully eliminated so that the component contribution to the magnetic field is exactly accounted for. In order to correctly represent inductance change due to the ground position, the proposed model inductance includes the effect of insulator layer thickness of the mounted printed circuit board. The inductances of series and the shunt measurements match very well, confirming that both methods extract correct parasitic inductance. Experimental analysis of a power distribution network inductance using the extracted model parameters achieved within 2% match with the measurement result.