• DocumentCode
    3396127
  • Title

    Reliability evaluation of systems with degradation and random shocks

  • Author

    Liu, Yu ; Huang, Hong-Zhong ; Pham, Hoang

  • Author_Institution
    Sch. of Mechatron. Eng., Univ. of Electron. Sci. & Technol. of China, Chengdu
  • fYear
    2008
  • fDate
    28-31 Jan. 2008
  • Firstpage
    328
  • Lastpage
    333
  • Abstract
    This paper introduces a proposed model to evaluate the reliability of multi-component degradation systems suffering two kinds of competing failure causes: internal degradation process and damage from external random shocks. The internal degradation is expressed as a random process with respect to working time, and a geometric process is employed to describe cumulative damage caused by external random shocks. In our proposed model, the system is assumed to be failed when internal degradation or cumulative damage from random shocks exceed random life thresholds. The reliability expression is derived when the random life threshold and degradation process are considered to follow a Weibull distribution. A studied case of series-parallel system is presented to illustrate the proposed model, and a numerical algorithm is provided to simplify the calculating process based on normal approximation and assess the system reliability. Finally, Monte Carlo simulation method is employed to verify the model and algorithms.
  • Keywords
    Monte Carlo methods; failure analysis; reliability; Monte Carlo simulation method; Weibull distribution; failure causes; internal degradation process; multicomponent degradation systems; numerical algorithm; random shocks; series-parallel system; system reliability evaluation; Availability; Degradation; Electric shock; Failure analysis; Maintenance; Random processes; Reliability; Solid modeling; Time varying systems; Weibull distribution; Monte Carlo simulation; degradation process; geometric process; random shocks; reliability evaluation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium, 2008. RAMS 2008. Annual
  • Conference_Location
    Las Vegas, NV
  • ISSN
    0149-144X
  • Print_ISBN
    978-1-4244-1460-4
  • Electronic_ISBN
    0149-144X
  • Type

    conf

  • DOI
    10.1109/RAMS.2008.4925817
  • Filename
    4925817