DocumentCode :
3396127
Title :
Reliability evaluation of systems with degradation and random shocks
Author :
Liu, Yu ; Huang, Hong-Zhong ; Pham, Hoang
Author_Institution :
Sch. of Mechatron. Eng., Univ. of Electron. Sci. & Technol. of China, Chengdu
fYear :
2008
fDate :
28-31 Jan. 2008
Firstpage :
328
Lastpage :
333
Abstract :
This paper introduces a proposed model to evaluate the reliability of multi-component degradation systems suffering two kinds of competing failure causes: internal degradation process and damage from external random shocks. The internal degradation is expressed as a random process with respect to working time, and a geometric process is employed to describe cumulative damage caused by external random shocks. In our proposed model, the system is assumed to be failed when internal degradation or cumulative damage from random shocks exceed random life thresholds. The reliability expression is derived when the random life threshold and degradation process are considered to follow a Weibull distribution. A studied case of series-parallel system is presented to illustrate the proposed model, and a numerical algorithm is provided to simplify the calculating process based on normal approximation and assess the system reliability. Finally, Monte Carlo simulation method is employed to verify the model and algorithms.
Keywords :
Monte Carlo methods; failure analysis; reliability; Monte Carlo simulation method; Weibull distribution; failure causes; internal degradation process; multicomponent degradation systems; numerical algorithm; random shocks; series-parallel system; system reliability evaluation; Availability; Degradation; Electric shock; Failure analysis; Maintenance; Random processes; Reliability; Solid modeling; Time varying systems; Weibull distribution; Monte Carlo simulation; degradation process; geometric process; random shocks; reliability evaluation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability and Maintainability Symposium, 2008. RAMS 2008. Annual
Conference_Location :
Las Vegas, NV
ISSN :
0149-144X
Print_ISBN :
978-1-4244-1460-4
Electronic_ISBN :
0149-144X
Type :
conf
DOI :
10.1109/RAMS.2008.4925817
Filename :
4925817
Link To Document :
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