DocumentCode
3396127
Title
Reliability evaluation of systems with degradation and random shocks
Author
Liu, Yu ; Huang, Hong-Zhong ; Pham, Hoang
Author_Institution
Sch. of Mechatron. Eng., Univ. of Electron. Sci. & Technol. of China, Chengdu
fYear
2008
fDate
28-31 Jan. 2008
Firstpage
328
Lastpage
333
Abstract
This paper introduces a proposed model to evaluate the reliability of multi-component degradation systems suffering two kinds of competing failure causes: internal degradation process and damage from external random shocks. The internal degradation is expressed as a random process with respect to working time, and a geometric process is employed to describe cumulative damage caused by external random shocks. In our proposed model, the system is assumed to be failed when internal degradation or cumulative damage from random shocks exceed random life thresholds. The reliability expression is derived when the random life threshold and degradation process are considered to follow a Weibull distribution. A studied case of series-parallel system is presented to illustrate the proposed model, and a numerical algorithm is provided to simplify the calculating process based on normal approximation and assess the system reliability. Finally, Monte Carlo simulation method is employed to verify the model and algorithms.
Keywords
Monte Carlo methods; failure analysis; reliability; Monte Carlo simulation method; Weibull distribution; failure causes; internal degradation process; multicomponent degradation systems; numerical algorithm; random shocks; series-parallel system; system reliability evaluation; Availability; Degradation; Electric shock; Failure analysis; Maintenance; Random processes; Reliability; Solid modeling; Time varying systems; Weibull distribution; Monte Carlo simulation; degradation process; geometric process; random shocks; reliability evaluation;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability and Maintainability Symposium, 2008. RAMS 2008. Annual
Conference_Location
Las Vegas, NV
ISSN
0149-144X
Print_ISBN
978-1-4244-1460-4
Electronic_ISBN
0149-144X
Type
conf
DOI
10.1109/RAMS.2008.4925817
Filename
4925817
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