DocumentCode :
3396140
Title :
Risk assessment for physical and cyber attacks on critical infrastructures
Author :
Depoy, J. ; Phelan, J. ; Sholander, P. ; Smith, B. ; Varnado, G.B. ; Wyss, G.
Author_Institution :
Sandia Nat. Labs., Albuquerque, NM
fYear :
2005
fDate :
17-20 Oct. 2005
Firstpage :
1961
Abstract :
Assessing the risk of malevolent attacks against large-scale critical infrastructures requires modifications to existing methodologies. Existing risk assessment methodologies consider physical security and cyber security separately. As such, they do not accurately model attacks that involve defeating both physical protection and cyber protection elements (e.g., hackers turning off alarm systems prior to forced entry). This paper presents a risk assessment methodology that accounts for both physical and cyber security. It also preserves the traditional security paradigm of detect, delay and respond, while accounting for the possibility that a facility may be able to recover from or mitigate the results of a successful attack before serious consequences occur. The methodology provides a means for ranking those assets most at risk from malevolent attacks. Because the methodology is automated the analyst can also play "what if with mitigation measures to gain a better understanding of how to best expend resources towards securing the facilities. It is simple enough to be applied to large infrastructure facilities without developing highly complicated models. Finally, it is applicable to facilities with extensive security as well as those that are less well-protected
Keywords :
alarm systems; risk management; telecommunication security; alarm systems; cyber protection elements; cyber security; large-scale critical infrastructures; risk assessment methodology; Alarm systems; Computer hacking; Computer security; Control systems; Delay; Laboratories; National security; Protection; Risk management; Turning;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Military Communications Conference, 2005. MILCOM 2005. IEEE
Conference_Location :
Atlantic City, NJ
Print_ISBN :
0-7803-9393-7
Type :
conf
DOI :
10.1109/MILCOM.2005.1605959
Filename :
1605959
Link To Document :
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