Title :
New developments in power quality immunity and voltage sag standards: Hands-on applications in North America, Asia, and Europe
Author :
Eberhard, Andreas ; McEachern, Alex
Author_Institution :
Power Stand. Lab., Alameda, CA
Abstract :
Power quality is a compatibility problem; it can be solved either by making the power better, or by making the loads tougher. The latter approach is encouraged by power quality immunity standards, which are rapidly changing. SEMI F47 has just been updated; IEC 61000-4-34 is starting to take effect internationally and soon in Europe; and other standards are coming on line. This paper discusses the author´s practical experience applying these standards to industrial equipment that ranges from industrial drives to automobile robots to infant formula factories, throughout the world. The authors will also introduce and explain the necessary requirements of the test instrument that is used for voltage sag testing.
Keywords :
IEC standards; power supply quality; Asia; Europe; IEC 61000-4-34 standard; North America; automobile robots; industrial drives; industrial equipment; infant formula factories; power quality immunity standards; voltage sag standards; Asia; Automobiles; Drives; Europe; IEC standards; Immunity testing; North America; Power quality; Standards development; Voltage fluctuations; Power quality; immunity; voltage dip; voltage dip testing;
Conference_Titel :
Transmission and Distribution Conference and Exposition, 2008. T&D. IEEE/PES
Conference_Location :
Chicago, IL
Print_ISBN :
978-1-4244-1903-6
Electronic_ISBN :
978-1-4244-1904-3
DOI :
10.1109/TDC.2008.4517055