Title :
Comparison of optimum demodulation of CPFSK with limiter-discriminator performance in jamming, interference and noise
Author :
Hampton, Jerry R. ; Oetting, John D. ; Merheb, Naim M.
Author_Institution :
Appl. Phys. Lab., Johns Hopkins Univ., Laurel, MD
Abstract :
The study examines the potential performance benefits and implementation issues associated with using a maximum likelihood demodulator in place of the commonly employed limiter-discriminator to demodulate a continuous-phase frequency shift keyed (CPFSK) signal in jamming, interference and thermal noise. The comparison is based on the results of running detailed computer simulations. The types of jamming that are considered include noise, tone, and follower jamming. The results show that the optimum demodulator can perform significantly better than the limiter-discriminator, ranging from an improvement of approximately 2 dB in thermal noise to as much as 7 dB in certain types of jamming environments. The results also show that the optimum demodulator provides better immunity against adjacent channel interference. In addition to considering performance advantages of optimum demodulation, the practicality of implementing the optimum demodulator is also addressed. Results are presented showing the relationship between data rate and the size and cost needed to implement the optimum demodulator using FPGA technology
Keywords :
continuous phase modulation; field programmable gate arrays; frequency shift keying; jamming; maximum likelihood decoding; thermal noise; CPFSK; FPGA technology; adjacent channel interference; computer simulations; continuous-phase frequency shift keyed signal; interference noise; jamming noise; limiter-discriminator performance; maximum likelihood demodulator; optimum demodulation; thermal noise; AWGN; Analytical models; Computer simulation; Demodulation; Frequency shift keying; Interference; Jamming; Military communication; Performance analysis; Working environment noise;
Conference_Titel :
Military Communications Conference, 2005. MILCOM 2005. IEEE
Conference_Location :
Atlantic City, NJ
Print_ISBN :
0-7803-9393-7
DOI :
10.1109/MILCOM.2005.1605962