• DocumentCode
    3396201
  • Title

    Electric field effects on piezoelectric and ferroelastic strain in Ba(Zr0.2Ti0.8)O3-x(Ba0.7Ca0.3)TiO3 piezoceramics

  • Author

    Ehmke, Matthias C. ; Blendell, J.E. ; Bowman, Keith J.

  • Author_Institution
    Sch. of Mater. Eng., Purdue Univ., West Lafayette, IN, USA
  • fYear
    2013
  • fDate
    21-25 July 2013
  • Firstpage
    84
  • Lastpage
    86
  • Abstract
    Rietveld analysis of synchrotron diffraction data is used to resolve the macroscopic strain response of tetragonal barium zirconate titanate-barium calcium titanate (BZT-BCT) piezoceramics and determine the underlying strain mechanisms. A lattice strain contribution and a ferroelastic switching contribution are identified and both contribute significantly to the macroscopic strain. A large electrically induced ferroelastic domain texture is observed that undergoes strong relaxation upon removal of the electric field. This suggests that under cyclic conditions each field application leads to a strong ferroelastic domain reorientation that is identified to be responsible for the good piezoelectric performance observed in this class of materials. Moreover, the significance of orientation dependent structural changes is identified, which is crucial to fully understand the macroscopic strain response.
  • Keywords
    barium compounds; calcium compounds; electric domains; electric field effects; ferroelasticity; internal stresses; piezoceramics; piezoelectricity; Ba(Zr0.2Ti0.8)O3-(Ba0.7Ca0.3)TiO3; electric field effects; ferroelastic domain reorientation; ferroelastic domain texture; ferroelastic strain; ferroelastic switching contribution; lattice strain contribution; macroscopic strain; piezoceramics; piezoelectric strain; Educational institutions; Image resolution; Lattices; Lead; Strain; XRD; lead-free; piezoelectrics; texture;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applications of Ferroelectric and Workshop on the Piezoresponse Force Microscopy (ISAF/PFM), 2013 IEEE International Symposium on the
  • Conference_Location
    Prague
  • Type

    conf

  • DOI
    10.1109/ISAF.2013.6748664
  • Filename
    6748664