DocumentCode
3396225
Title
Probabilistic common-cause failures analysis
Author
Xing, Liudong ; Wang, Wendai
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of Massachusetts Dartmouth, North Dartmouth, MA
fYear
2008
fDate
28-31 Jan. 2008
Firstpage
354
Lastpage
358
Abstract
Common-cause failures (CCF) are simultaneous failures of multiple components within a system due to a common-cause or a shared root cause. CCF can contribute significantly to the overall system unreliability. Therefore, it is important to incorporate CCF into the system reliability analysis. Traditional CCF analyses have assumed that the occurrence of a common-cause results in the deterministic/guaranteed failure of components affected by that common-cause. In practical systems, however, the occurrence of a common-cause may result into failures of different components with different probabilities of occurrence. This behavior is termed as probabilistic CCF (PCCF). In this paper, we present a combinatorial method for the reliability analysis of systems subject to PCCF. The approach is represented in a dynamic fault tree model by a proposed probabilistic CCF gate. Basics of the proposed approach and effects of PCCF on the system reliability are illustrated through the detailed quantitative analysis of an example system.
Keywords
binary decision diagrams; failure analysis; probability; reliability; multiple components; probabilistic common-cause failures analysis; shared root cause; systems reliability analysis; Cause effect analysis; Earthquakes; Electric shock; Failure analysis; Fault tolerant systems; Fault trees; Floods; Humans; Materials reliability; Redundancy; common-cause failures; probabilistic; reliability analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability and Maintainability Symposium, 2008. RAMS 2008. Annual
Conference_Location
Las Vegas, NV
ISSN
0149-144X
Print_ISBN
978-1-4244-1460-4
Electronic_ISBN
0149-144X
Type
conf
DOI
10.1109/RAMS.2008.4925821
Filename
4925821
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