• DocumentCode
    3396225
  • Title

    Probabilistic common-cause failures analysis

  • Author

    Xing, Liudong ; Wang, Wendai

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Massachusetts Dartmouth, North Dartmouth, MA
  • fYear
    2008
  • fDate
    28-31 Jan. 2008
  • Firstpage
    354
  • Lastpage
    358
  • Abstract
    Common-cause failures (CCF) are simultaneous failures of multiple components within a system due to a common-cause or a shared root cause. CCF can contribute significantly to the overall system unreliability. Therefore, it is important to incorporate CCF into the system reliability analysis. Traditional CCF analyses have assumed that the occurrence of a common-cause results in the deterministic/guaranteed failure of components affected by that common-cause. In practical systems, however, the occurrence of a common-cause may result into failures of different components with different probabilities of occurrence. This behavior is termed as probabilistic CCF (PCCF). In this paper, we present a combinatorial method for the reliability analysis of systems subject to PCCF. The approach is represented in a dynamic fault tree model by a proposed probabilistic CCF gate. Basics of the proposed approach and effects of PCCF on the system reliability are illustrated through the detailed quantitative analysis of an example system.
  • Keywords
    binary decision diagrams; failure analysis; probability; reliability; multiple components; probabilistic common-cause failures analysis; shared root cause; systems reliability analysis; Cause effect analysis; Earthquakes; Electric shock; Failure analysis; Fault tolerant systems; Fault trees; Floods; Humans; Materials reliability; Redundancy; common-cause failures; probabilistic; reliability analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium, 2008. RAMS 2008. Annual
  • Conference_Location
    Las Vegas, NV
  • ISSN
    0149-144X
  • Print_ISBN
    978-1-4244-1460-4
  • Electronic_ISBN
    0149-144X
  • Type

    conf

  • DOI
    10.1109/RAMS.2008.4925821
  • Filename
    4925821