Title :
(Ag,Li)NbO3 thin films fabricated on (001), (110), and (111)SrTiO3 substrates by pulsed laser deposition
Author :
Yamamoto, Yu. ; Fujii, Ichiro ; Wada, Tomotaka
Author_Institution :
Dept. of Mater. Chem., Ryukoku Univ., Otsu, Japan
Abstract :
001-, 110-, 111-oriented (Ag1-xLix)NbO3 (ALN) films with x=0.05 (ALN05), 0.1 (ALN10), and 0.15 (ALN15) were fabricated on (001), (110) and (111) SrTiO3 (STO) substrates by pulse laser deposition (PLD). The surface texture of the ALN films ware dependent on the crystal orientation of STO substrates. All the ALN films exhibited a ferroelectric behavior. The ALN films with x=0.1 deposited on (111) STO showed the largest remanent polarization of 40μC/cm2.
Keywords :
dielectric polarisation; ferroelectric ceramics; ferroelectric thin films; ferroelectricity; lithium compounds; pulsed laser deposition; silver compounds; surface texture; (001) SrTiO3 substrates; (110) SrTiO3 substrates; (111) SrTiO3 substrates; (Ag1-xLix)NbO3; 001-oriented thin films; 110-oriented thin films; 111-oriented thin films; PLD; SrTiO3; crystal orientation; ferroelectric behavior; pulsed laser deposition; remanent polarization; surface texture; Ceramics; Films; Laser theory; Lead; Substrates; (Ag,Li)NbO3; AgNbO3; LiNbO3; PLD; pulsed laser deposition; thin film;
Conference_Titel :
Applications of Ferroelectric and Workshop on the Piezoresponse Force Microscopy (ISAF/PFM), 2013 IEEE International Symposium on the
Conference_Location :
Prague
DOI :
10.1109/ISAF.2013.6748673
