• DocumentCode
    3396345
  • Title

    The measuring system of photo-stimulated discharge based on the OPO laser

  • Author

    He, Lijuan ; Chen, Yang ; Yang, Chun ; Tian, Fuqiang ; Zhao, Lei ; Wang, Xuan ; Lei, Qingquan

  • Author_Institution
    Coll. of Appl. Sci., Harbin Univ. of Sci. & Technol., Harbin, China
  • fYear
    2009
  • fDate
    19-23 July 2009
  • Firstpage
    984
  • Lastpage
    987
  • Abstract
    Photo-stimulated discharge (PSD) is an effective method to characterize the deep traps in the dielectric materials. In this paper, a new PSD measuring system was firstly built up based on the optical parametric oscillator laser. The laser can generate continuously tunable wavelength output light of which wavelength range is 210-420 nm and average output pulse energy is 2.3 mJ. The system overcomes the shortcoming of weak output energy in the experiments before, especially in the range of ultraviolet band. Experiments proved that this PSD system can work well and can be widely used in the theoretical and practical research of the dielectric materials.
  • Keywords
    deep levels; dielectric materials; discharges (electric); measurement by laser beam; optical parametric oscillators; OPO laser; continuously tunable wavelength output light; deep traps; dielectric materials; measuring system; optical parametric oscillator laser; photostimulated discharge; wavelength 210 nm to 420 nm; Dielectric materials; Dielectric measurements; Dielectrics and electrical insulation; Educational institutions; Educational technology; Electron traps; Material storage; Optical distortion; Optical polymers; Space charge; deep trap; optical parametric oscillator; photo-stimulated discharge; space charge;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Properties and Applications of Dielectric Materials, 2009. ICPADM 2009. IEEE 9th International Conference on the
  • Conference_Location
    Harbin
  • Print_ISBN
    978-1-4244-4367-3
  • Electronic_ISBN
    978-1-4244-4368-0
  • Type

    conf

  • DOI
    10.1109/ICPADM.2009.5252277
  • Filename
    5252277