DocumentCode
3396390
Title
Mismatch characterisation of chip interconnect resistance
Author
Deveugele, Jurgen ; Yao, Libin ; Steyaert, Michiel ; Sansen, Wiliy
Author_Institution
Katholieke Univ., Leuven, Belgium
fYear
2005
fDate
4-7 April 2005
Firstpage
183
Lastpage
186
Abstract
Many analog circuits use matched resistors on chip. The resistors have two components: the resistive elements and the interconnects. The resistive elements have good matching properties. However, the resistance of the interconnects - especially of the contacts and vias - is only guaranteed to be within certain wide limits. If the matched resistors are low-ohmic, then the interconnect dominates the mismatch equations. This is often solved by oversizing the interconnect or by avoiding structures with lots of interconnect. We prefer to characterize these interconnects or even to build resistors using only interconnects. The measurement results show that the interconnect resistance can match as well as poly resistors in the same 0.18 μm technology.
Keywords
analogue integrated circuits; electric resistance; integrated circuit interconnections; resistors; 0.18 micron; analog circuits; chip interconnect resistance mismatch characterisation; matched resistors; resistive elements; Analog circuits; Capacitors; Contact resistance; Electrical resistance measurement; Equations; Integrated circuit interconnections; Integrated circuit measurements; Resistors; Semiconductor device measurement; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Microelectronic Test Structures, 2005. ICMTS 2005. Proceedings of the 2005 International Conference on
Print_ISBN
0-7803-8855-0
Type
conf
DOI
10.1109/ICMTS.2005.1452259
Filename
1452259
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