• DocumentCode
    3396476
  • Title

    An analysis on measurement sensitivity of Short-Pulse Propagation technique using a virtual test bench

  • Author

    Zhou, Zhen ; Deutsch, Alina ; Melde, Kathleen L. ; Katopis, George A. ; Morsey, Jason D.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Arizona, Tucson, AZ
  • fYear
    2008
  • fDate
    27-29 Oct. 2008
  • Firstpage
    213
  • Lastpage
    216
  • Abstract
    This paper presents the concept of using a virtual test bench to emulate measurements via simulation and modeling. For demonstration purposes, this idea is used to quantify the measurement sensitivity of the short-pulse propagation technique to the line parameter tolerances found in production level circuit boards without building the hardware. This method is applicable to other measurement methodologies such as in the calibration and de-embedding steps of frequency-domain characterization.
  • Keywords
    frequency-domain analysis; virtual instrumentation; frequency-domain characterization; line parameter tolerances; measurement sensitivity analysis; production level circuit boards; short-pulse propagation technique; virtual test bench; Circuit simulation; Circuit testing; Electric variables measurement; Electronic equipment testing; Fabrication; Hardware; Printed circuits; Production; Stripline; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Performance of Electronic Packaging, 2008 IEEE-EPEP
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    978-1-4244-2873-1
  • Type

    conf

  • DOI
    10.1109/EPEP.2008.4675917
  • Filename
    4675917