Title :
Stepper registration analysis using Monte Carlo modeling
Author :
Waldo, Whit G. ; Selinidis, Kosta ; Espenscheid, Andy
Author_Institution :
Motorola Inc., Austin, TX, USA
Abstract :
This paper presents an analysis of stepper registration using Monte Carlo modeling. Registration data are collected from an array of many error vectors and assimilated in the form of a multiple linear equation where each coefficient in the equation represents a different geometrical error. Data are collected periodically from several tools. Nested variance analysis was used to study the different families of variation for the geometrical errors. Component coefficient variations are studied for normality and Monte Carlo simulation is used to predict the distributions of errors that will be seen over time. The interaction of intrafield and interfield errors can be easily handled with this approach to generate the total registration error
Keywords :
Monte Carlo methods; error analysis; photolithography; semiconductor technology; statistical analysis; Monte Carlo modeling; component coefficient variations; error distributions; error vectors; geometrical error; interfield errors; intrafield errors; multiple linear equation; nested variance analysis; registration analysis; stepper registration; total registration error; Analysis of variance; Differential equations; Error correction; Lenses; Monte Carlo methods; Predictive models; Reliability engineering; Signal processing; Testing; Vectors;
Conference_Titel :
Advanced Semiconductor Manufacturing Conference and Workshop, 1997. IEEE/SEMI
Conference_Location :
Cambridge, MA
Print_ISBN :
0-7803-4050-7
DOI :
10.1109/ASMC.1997.630753