DocumentCode :
3396552
Title :
Compact on-chip wire models for the clock distribution of high-speed I/O interfaces
Author :
Qi, Xiaoning ; Kim, Joong-Ho ; Yang, Ling ; Schmitt, Ralf ; Yuan, Chuck
Author_Institution :
Rambus Inc., Los Altos, CA
fYear :
2008
fDate :
27-29 Oct. 2008
Firstpage :
235
Lastpage :
238
Abstract :
A lumped wire model is proposed for on-chip clock in the low-power and multi-gigahertz IO clock distributions. Ignoring the skin effect and inductive forward coupling, this model can be easily extracted using QuickCap and FastHenry, instead of more computing intensive full-wave solvers. Surrounding power/ground and signal wires within a 1000-mum window are all included in this model. The resulting SPICE netlist and simulation accurately model multiple current returns and the proximity effect at high frequencies. This model is validated with measured S-parameter up to 20 GHz using a 90 nm testing chip. The effective loop inductance is shown to have 2times frequency variations which impacts directly on the peak frequency of an LC resonance clock distribution.
Keywords :
SPICE; wires (electric); FastHenry; LC resonance clock distribution; QuickCap; SPICE netlist; compact on-chip wire models; high-speed I-O interfaces; inductive forward coupling; low-power IO clock distributions; lumped wire model; multi-gigahertz IO clock distributions; on-chip clock; skin effect; Clocks; Computational modeling; Frequency; Proximity effect; SPICE; Scattering parameters; Semiconductor device measurement; Skin effect; Testing; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Performance of Electronic Packaging, 2008 IEEE-EPEP
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4244-2873-1
Type :
conf
DOI :
10.1109/EPEP.2008.4675923
Filename :
4675923
Link To Document :
بازگشت