• DocumentCode
    3396552
  • Title

    Compact on-chip wire models for the clock distribution of high-speed I/O interfaces

  • Author

    Qi, Xiaoning ; Kim, Joong-Ho ; Yang, Ling ; Schmitt, Ralf ; Yuan, Chuck

  • Author_Institution
    Rambus Inc., Los Altos, CA
  • fYear
    2008
  • fDate
    27-29 Oct. 2008
  • Firstpage
    235
  • Lastpage
    238
  • Abstract
    A lumped wire model is proposed for on-chip clock in the low-power and multi-gigahertz IO clock distributions. Ignoring the skin effect and inductive forward coupling, this model can be easily extracted using QuickCap and FastHenry, instead of more computing intensive full-wave solvers. Surrounding power/ground and signal wires within a 1000-mum window are all included in this model. The resulting SPICE netlist and simulation accurately model multiple current returns and the proximity effect at high frequencies. This model is validated with measured S-parameter up to 20 GHz using a 90 nm testing chip. The effective loop inductance is shown to have 2times frequency variations which impacts directly on the peak frequency of an LC resonance clock distribution.
  • Keywords
    SPICE; wires (electric); FastHenry; LC resonance clock distribution; QuickCap; SPICE netlist; compact on-chip wire models; high-speed I-O interfaces; inductive forward coupling; low-power IO clock distributions; lumped wire model; multi-gigahertz IO clock distributions; on-chip clock; skin effect; Clocks; Computational modeling; Frequency; Proximity effect; SPICE; Scattering parameters; Semiconductor device measurement; Skin effect; Testing; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Performance of Electronic Packaging, 2008 IEEE-EPEP
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    978-1-4244-2873-1
  • Type

    conf

  • DOI
    10.1109/EPEP.2008.4675923
  • Filename
    4675923