• DocumentCode
    3396821
  • Title

    Fault diagnosis in a flash

  • Author

    Beigel, Richard ; Hurwood, William ; Kahale, Nabil

  • Author_Institution
    Dept. of Comput. Sci., Yale Univ., New Haven, CT, USA
  • fYear
    1995
  • fDate
    23-25 Oct 1995
  • Firstpage
    571
  • Lastpage
    580
  • Abstract
    Consider a set of n processors that can communicate with each other. Assume that each processor can be either “good” or “faulty”. Also assume that the processors can test each other. We consider how to use parallel testing rounds to identify the faulty processors, given an upper bound t on their number. We prove that 4 rounds are necessary and sufficient when 2√(2n)⩽0.03n (for n sufficiently large). Furthermore, at least 5 rounds are necessary when t⩾0.49n (for n sufficiently large), and 10 rounds are sufficient when t<0.5n (for all n). (It is well known that no general solution is possible when t⩾0.5n)
  • Keywords
    built-in self test; computer testing; fault diagnosis; fault tolerant computing; parallel algorithms; reliability; deterministic preprocessing; fault diagnosis; faulty processors; parallel testing rounds; randomised preprocessing; Accidents; Computed tomography; Computer science; Fault diagnosis; Fault tolerance; Performance evaluation; Protocols; Robots; Testing; Upper bound;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Foundations of Computer Science, 1995. Proceedings., 36th Annual Symposium on
  • Conference_Location
    Milwaukee, WI
  • ISSN
    0272-5428
  • Print_ISBN
    0-8186-7183-1
  • Type

    conf

  • DOI
    10.1109/SFCS.1995.492587
  • Filename
    492587