Title :
Fault diagnosis in a flash
Author :
Beigel, Richard ; Hurwood, William ; Kahale, Nabil
Author_Institution :
Dept. of Comput. Sci., Yale Univ., New Haven, CT, USA
Abstract :
Consider a set of n processors that can communicate with each other. Assume that each processor can be either “good” or “faulty”. Also assume that the processors can test each other. We consider how to use parallel testing rounds to identify the faulty processors, given an upper bound t on their number. We prove that 4 rounds are necessary and sufficient when 2√(2n)⩽0.03n (for n sufficiently large). Furthermore, at least 5 rounds are necessary when t⩾0.49n (for n sufficiently large), and 10 rounds are sufficient when t<0.5n (for all n). (It is well known that no general solution is possible when t⩾0.5n)
Keywords :
built-in self test; computer testing; fault diagnosis; fault tolerant computing; parallel algorithms; reliability; deterministic preprocessing; fault diagnosis; faulty processors; parallel testing rounds; randomised preprocessing; Accidents; Computed tomography; Computer science; Fault diagnosis; Fault tolerance; Performance evaluation; Protocols; Robots; Testing; Upper bound;
Conference_Titel :
Foundations of Computer Science, 1995. Proceedings., 36th Annual Symposium on
Conference_Location :
Milwaukee, WI
Print_ISBN :
0-8186-7183-1
DOI :
10.1109/SFCS.1995.492587