DocumentCode
3396821
Title
Fault diagnosis in a flash
Author
Beigel, Richard ; Hurwood, William ; Kahale, Nabil
Author_Institution
Dept. of Comput. Sci., Yale Univ., New Haven, CT, USA
fYear
1995
fDate
23-25 Oct 1995
Firstpage
571
Lastpage
580
Abstract
Consider a set of n processors that can communicate with each other. Assume that each processor can be either “good” or “faulty”. Also assume that the processors can test each other. We consider how to use parallel testing rounds to identify the faulty processors, given an upper bound t on their number. We prove that 4 rounds are necessary and sufficient when 2√(2n)⩽0.03n (for n sufficiently large). Furthermore, at least 5 rounds are necessary when t⩾0.49n (for n sufficiently large), and 10 rounds are sufficient when t<0.5n (for all n). (It is well known that no general solution is possible when t⩾0.5n)
Keywords
built-in self test; computer testing; fault diagnosis; fault tolerant computing; parallel algorithms; reliability; deterministic preprocessing; fault diagnosis; faulty processors; parallel testing rounds; randomised preprocessing; Accidents; Computed tomography; Computer science; Fault diagnosis; Fault tolerance; Performance evaluation; Protocols; Robots; Testing; Upper bound;
fLanguage
English
Publisher
ieee
Conference_Titel
Foundations of Computer Science, 1995. Proceedings., 36th Annual Symposium on
Conference_Location
Milwaukee, WI
ISSN
0272-5428
Print_ISBN
0-8186-7183-1
Type
conf
DOI
10.1109/SFCS.1995.492587
Filename
492587
Link To Document