Title :
Extraction of time dependent data from time domain reflection transmission line pulse measurements [ESD protection design]
Author :
Ashton, Robert A.
Author_Institution :
White Mountain Labs, Phoenix, AZ, USA
Abstract :
Transmission line pulse (TLP) measurements are an important tool in ESD protection design. The traditional TLP I-V curve only delivers part of the information available. This paper discusses the extraction of V(t) and I(t) data from each pulse in a time domain reflection TLP system.
Keywords :
electric current measurement; electrostatic discharge; integrated circuit measurement; pulse measurement; semiconductor device measurement; time-domain reflectometry; voltage measurement; ESD protection design; TLP system; time dependent current measurements; time dependent data extraction; time dependent voltage measurements; time domain reflection transmission line pulse measurements; Current measurement; Data mining; Electrostatic discharge; Integrated circuit modeling; Oscilloscopes; Probes; Pulse measurements; Testing; Transmission line measurements; Voltage;
Conference_Titel :
Microelectronic Test Structures, 2005. ICMTS 2005. Proceedings of the 2005 International Conference on
Print_ISBN :
0-7803-8855-0
DOI :
10.1109/ICMTS.2005.1452278
