Title :
Dynamics assessment of voltage flicker
Author :
Hsu, Y.J. ; Chen, K.H. ; Lu, C.N.
Author_Institution :
Dept. of Electr. Eng., Nat. Sun Yat-Sen Univ., Kaohsiung
Abstract :
In this paper, short term voltage flicker indices, Pst and Deltardquo V10, recorded at an AC electric arc furnace (EAF) are analyzed by using non-linearity techniques. A fractal dimension based method is used, in which, the Hurst exponent provides the fractal dimension information. It is shown that voltage flicker is fractal. The application of Lyapunov exponent for chaos identification and, using the obtained fractal dimension, the construction of the phase space are described. Voltage flicker recurrence plot and recurrence quantification analysis results are compared with those from a chaos system. The possible chaotic behavior and maximum predictable time scale of the observed time series are investigated.
Keywords :
Lyapunov methods; arc furnaces; power supply quality; AC electric arc furnace; Lyapunov exponent; chaos identification; nonlinearity techniques; voltage flicker dynamics assessment; Chaos; Fractals; Frequency estimation; Furnaces; Lamps; Linearity; Nonlinear dynamical systems; Stochastic processes; Voltage fluctuations; Voltage measurement; Hurst exponent; Lyapunov exponent; arc furnaces; chaos; fractal; recurrence plot; recurrence quantification analysis; voltage flicker;
Conference_Titel :
Transmission and Distribution Conference and Exposition, 2008. T&D. IEEE/PES
Conference_Location :
Chicago, IL
Print_ISBN :
978-1-4244-1903-6
Electronic_ISBN :
978-1-4244-1904-3
DOI :
10.1109/TDC.2008.4517115