• DocumentCode
    3397222
  • Title

    PLD growth and PFM study of self-poled, mono-crystalline PZT thin films

  • Author

    Mtebwa, Mahamudu ; Feigl, L. ; Setter, Nava

  • Author_Institution
    Ceramic Lab., Swiss Fed. Inst. of Technol. of Lausanne, Lausanne, Switzerland
  • fYear
    2013
  • fDate
    21-25 July 2013
  • Firstpage
    73
  • Lastpage
    75
  • Abstract
    In this work we report the growth of high quality, fully epitaxial, mono-crystalline Pb (Zr0.5T0.5)O3 thin films with step flow growth mode by PLD. For the first time the study of self-polarization in doped mono-crystalline PZT thin films using PFM is presented. The direction of self-polarization in pure PZT on SRO is upwards whereas that of Fe dopes PZT is downwards. The behavior is explained by trapped oxygen vacancies at the film-electrode interface as well as lead vacancies gradient in the bulk.
  • Keywords
    dielectric polarisation; lead compounds; piezoelectric thin films; pulsed laser deposition; vacancies (crystal); PFM; PLD; PZT; film-electrode interface; monocrystalline thin films; self-poled thin films; trapped oxygen vacancies; Atomic layer deposition; Electrodes; Epitaxial growth; Iron; Surface treatment; Switches; X-ray scattering; PFM; PZT; Self polarization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applications of Ferroelectric and Workshop on the Piezoresponse Force Microscopy (ISAF/PFM), 2013 IEEE International Symposium on the
  • Conference_Location
    Prague
  • Type

    conf

  • DOI
    10.1109/ISAF.2013.6748726
  • Filename
    6748726
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3397222