DocumentCode :
3397222
Title :
PLD growth and PFM study of self-poled, mono-crystalline PZT thin films
Author :
Mtebwa, Mahamudu ; Feigl, L. ; Setter, Nava
Author_Institution :
Ceramic Lab., Swiss Fed. Inst. of Technol. of Lausanne, Lausanne, Switzerland
fYear :
2013
fDate :
21-25 July 2013
Firstpage :
73
Lastpage :
75
Abstract :
In this work we report the growth of high quality, fully epitaxial, mono-crystalline Pb (Zr0.5T0.5)O3 thin films with step flow growth mode by PLD. For the first time the study of self-polarization in doped mono-crystalline PZT thin films using PFM is presented. The direction of self-polarization in pure PZT on SRO is upwards whereas that of Fe dopes PZT is downwards. The behavior is explained by trapped oxygen vacancies at the film-electrode interface as well as lead vacancies gradient in the bulk.
Keywords :
dielectric polarisation; lead compounds; piezoelectric thin films; pulsed laser deposition; vacancies (crystal); PFM; PLD; PZT; film-electrode interface; monocrystalline thin films; self-poled thin films; trapped oxygen vacancies; Atomic layer deposition; Electrodes; Epitaxial growth; Iron; Surface treatment; Switches; X-ray scattering; PFM; PZT; Self polarization;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Applications of Ferroelectric and Workshop on the Piezoresponse Force Microscopy (ISAF/PFM), 2013 IEEE International Symposium on the
Conference_Location :
Prague
Type :
conf
DOI :
10.1109/ISAF.2013.6748726
Filename :
6748726
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3397222
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