Built in test (BIT) in a commercial signal generator

Author

Sprader, Gary L.

Author_Institution

Hewlett-Packard Co., Spokane, WA, USA

fYear

1989

fDate

25-28 Sep 1989

Firstpage

314

Lastpage

318

Abstract

The implementation of internal diagnostics in Hewlett-Packard´s newest series of RF signal generator products is described. Using an assembly-level repair support strategy, it is possible to repair most instrument failures quickly without the use of external test equipment. Testing of individual assemblies in the instrument is done with a series of analog multiplexers, an internal voltmeter with AC and DC measurement capability, and an internal RF power meter. An interactive troubleshooting mode is used to find problems in the interconnections between assemblies

Keywords

electronic equipment testing; production testing; signal generators; voltage measurement; AC; DC; Hewlett Packard; RF signal generator; analog multiplexers; assembly-level repair support strategy; built in test; instrument failures; interactive troubleshooting mode; interconnections; internal RF power meter; internal diagnostics; internal voltmeter; Assembly; Built-in self-test; Connectors; Instruments; Multiplexing; Radio frequency; Signal generators; Testing; Voltage measurement; Voltmeters;

fLanguage

English

Publisher

ieee

Conference_Titel

AUTOTESTCON '89. IEEE Automatic Testing Conference. The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.

Conference_Location

Philadelphia, PA

Type

conf

DOI

10.1109/AUTEST.1989.81140

Filename

81140