Title :
Built in test (BIT) in a commercial signal generator
Author :
Sprader, Gary L.
Author_Institution :
Hewlett-Packard Co., Spokane, WA, USA
Abstract :
The implementation of internal diagnostics in Hewlett-Packard´s newest series of RF signal generator products is described. Using an assembly-level repair support strategy, it is possible to repair most instrument failures quickly without the use of external test equipment. Testing of individual assemblies in the instrument is done with a series of analog multiplexers, an internal voltmeter with AC and DC measurement capability, and an internal RF power meter. An interactive troubleshooting mode is used to find problems in the interconnections between assemblies
Keywords :
electronic equipment testing; production testing; signal generators; voltage measurement; AC; DC; Hewlett Packard; RF signal generator; analog multiplexers; assembly-level repair support strategy; built in test; instrument failures; interactive troubleshooting mode; interconnections; internal RF power meter; internal diagnostics; internal voltmeter; Assembly; Built-in self-test; Connectors; Instruments; Multiplexing; Radio frequency; Signal generators; Testing; Voltage measurement; Voltmeters;
Conference_Titel :
AUTOTESTCON '89. IEEE Automatic Testing Conference. The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.
Conference_Location :
Philadelphia, PA
DOI :
10.1109/AUTEST.1989.81140
