DocumentCode
3397373
Title
Comparing TCSC placements on mid-point and ends of second circuit of double circuit line from measured impedance point of view
Author
Jamali, S. ; Kazemi, A. ; Shateri, H.
Author_Institution
Dept. of Electr. Eng., Iran Univ. of Sci. & Technol., Tehran
fYear
2008
fDate
21-24 April 2008
Firstpage
1
Lastpage
7
Abstract
Distance relays are widely used as the main and back-up protection for transmission lines. They operate based on measured impedance at the relaying point, which is affected by several factors including pre-fault line loading and short circuit levels at the line ends. Introduction of Flexible Alternating Current Transmission System (FACTS) devices imposes further changes on the measured impedance at the relaying point. This paper studies the effect of the presence of Thyristor Controlled Series Compensator (TCSC) on the second circuit of a double circuit transmission line, on the measured impedance at the relaying point. In the presence of TCSC, the measured impedance at the relaying point is affected not only with its compensation degree, but also with its installation point. Here, the measured impedance at relaying point is compared when a lumped TCSC is installed at the mid-point of the second circuit and once two part TCSC is at the line ends.
Keywords
fault diagnosis; flexible AC transmission systems; power transmission faults; power transmission protection; relay protection; thyristors; distance relays; flexible alternating current transmission system devices; pre-fault line loading; short circuit levels; thyristor controlled series compensator; transmission lines back-up protection; Current measurement; Distributed parameter circuits; Flexible AC transmission systems; Impedance measurement; Power capacitors; Protection; Protective relaying; Relays; Thyristors; Transmission line measurements; Distance protection; Double circuit line; FACTS devices; Fault resistance; TCSC; Tripping characteristic;
fLanguage
English
Publisher
ieee
Conference_Titel
Transmission and Distribution Conference and Exposition, 2008. T&D. IEEE/PES
Conference_Location
Chicago, IL
Print_ISBN
978-1-4244-1903-6
Electronic_ISBN
978-1-4244-1904-3
Type
conf
DOI
10.1109/TDC.2008.4517125
Filename
4517125
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