Title :
Tester-assisted built in test
Author :
Guntheroth, Kurt
Author_Institution :
John Fluke Manuf. Co. Inc., Everett, WA, USA
Abstract :
It is noted that board makers invest considerable time and money writing extensive self-tests and that this investment can be multiplied by selecting ATE (automatic test equipment) that complements and extends the power of the self-test. The tester can diagnose boards in situations where a fault prevents the self-test from running. If the tester monitors such resources as processor, memory, and I/O, confidence in test results is improved. The tester can be used during development of the self-test and to turn on prototypes before the self-test is complete. The author argues that emulative functional testers outperform other types of ATE on boards with BST (built-in self-test) and lists features of emulative functional testers that are most important to users of BIST
Keywords :
automatic test equipment; automatic testing; printed circuit testing; ATE; BST; PCB testing; built-in self-test; emulative functional testers; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Displays; Investments; Kernel; Manufacturing; Read-write memory; Writing;
Conference_Titel :
AUTOTESTCON '89. IEEE Automatic Testing Conference. The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.
Conference_Location :
Philadelphia, PA
DOI :
10.1109/AUTEST.1989.81141
