Title :
Application of low-voltage SPDs: approach of the IEEE
Author :
Hotchkiss, Ronald W.
Author_Institution :
Surge Suppression Inc., Destin, FL
Abstract :
Given the emphasis on power quality and system reliability and the multitude of technical challenges this presents; this paper will outline the IEEE´s approach to surge protection through explanation of the expected transient voltage surge environment in an electrical system with a focus on the potential sources of these surges, the coupling of surges to and the interaction with other systems such as communication and data circuits, issues related to surge propagation within the electrical system, and testing of surge protective devices. Further, this paper will provide instruction on a number of application and installation issues when selecting and applying surge protective devices for the power and data systems. Although this paper if primarily focused on the power system, discussion and references are provided for related issues regarding low-voltage data and communication circuits.
Keywords :
power supply quality; reliability; surge protection; IEEE approach; communication circuits; data circuits; electrical system; low-voltage surge protective devices; power quality; surge propagation; system reliability; Circuit testing; Coupling circuits; Power quality; Power system transients; Reliability; Surge Protective Devices - c62; Surge protection; Surges; System testing; Voltage; SCCR; SPD; TVSS; coordination; lead length; lightning; power quality; short-circuit current rating; surge protective device; switching surge;
Conference_Titel :
Transmission and Distribution Conference and Exposition, 2008. T&D. IEEE/PES
Conference_Location :
Chicago, IL
Print_ISBN :
978-1-4244-1903-6
Electronic_ISBN :
978-1-4244-1904-3
DOI :
10.1109/TDC.2008.4517147