• DocumentCode
    3397962
  • Title

    Frequency dispersion in GaAs metal-semiconductor field-effect transistor transconductance

  • Author

    Prokhorov, E.F. ; Gorev, N.B. ; Kodzhespirova, I.F. ; Privalov, E.N.

  • Author_Institution
    Centro de Investig. en Materialos Av., Chihuahua
  • fYear
    2008
  • fDate
    8-12 Sept. 2008
  • Firstpage
    143
  • Lastpage
    144
  • Abstract
    A quasi-2D numerical model a GaAs metal-semiconductor field-effect transistor, which drops the conventional sharp-boundary approximation, is presented. Using this model, both the low- and the high-frequency transistor transconductance is calculated. It is shown that the transconductance shows marked frequency dispersion in the drain current saturation region, which may have a significant impact on the small-signal voltage gain of a transistor amplifier.
  • Keywords
    III-V semiconductors; Schottky gate field effect transistors; amplifiers; gallium arsenide; GaAs; conventional sharp-boundary approximation; drain current saturation; frequency dispersion; high-frequency transistor transconductance; low-frequency transistor transconductance; metal-semiconductor field-effect transistor transconductance; quasi-2D numerical model; small-signal voltage gain; transistor amplifier; Electronic mail; FETs; Frequency; Gallium arsenide; Intrusion detection; MESFETs; Metals industry; Substrates; Threshold voltage; Transconductance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave & Telecommunication Technology, 2008. CriMiCo 2008. 2008 18th International Crimean Conference
  • Conference_Location
    Sevastopol, Crimea
  • Print_ISBN
    978-966-335-166-7
  • Electronic_ISBN
    978-966-335-169-8
  • Type

    conf

  • DOI
    10.1109/CRMICO.2008.4676324
  • Filename
    4676324