Title :
Development of automatic diagnostic test system for mixed-signal/analog integrated circuits
Author :
Huang, Wei-Hsing ; Wey, Chin-Long
Author_Institution :
Dept. of Electr. Eng., Michigan State Univ., East Lansing, MI, USA
Abstract :
This system for mixed-signal/analog integrated circuits is divided into off-line test program development process and on-line test application process. During the off-line development phase, generated test programs are described by using HDL-A and simulation tools, and validated by a test system interfacing the unit under test, where Labview, a general-purpose programming tool, is used as a virtual instrument.
Keywords :
analogue integrated circuits; automatic testing; digital simulation; fault diagnosis; hardware description languages; integrated circuit testing; mixed analogue-digital integrated circuits; HDL-A; Labview; automatic diagnostic test system; general-purpose programming tool; mixed-signal/analog integrated circuits; off-line test program development; on-line test application process; simulation tools; virtual instrument; Analog integrated circuits; Automatic programming; Automatic testing; Built-in self-test; Circuit testing; Equations; Fault diagnosis; Integrated circuit testing; System testing; Vectors;
Conference_Titel :
Circuits and Systems, 1997. Proceedings of the 40th Midwest Symposium on
Print_ISBN :
0-7803-3694-1
DOI :
10.1109/MWSCAS.1997.662353
