Title :
A PHYSICAL MODEL OF THE ELECTRICAL BREAKDOWN IN HIGH FIELD SEMICONDUCTOR- DIELECTRIC SYSTEMS
Author :
Gradinaru, G. ; Sudarshan, T.S.
Keywords :
Breakdown voltage; Condition monitoring; Dielectric breakdown; Electric breakdown; Flashover; Metallization; Semiconductor device breakdown; Surface discharges; System analysis and design; Time factors;
Conference_Titel :
Power Modulator Symposium, 1992. Conference Record of the 1992 Twentieth
Print_ISBN :
0-7803-0718-6
DOI :
10.1109/MODSYM.1992.492637
