Title :
An improved model for SOI enhancement and depletion JFETs with nonuniform channel parameters for low/high-speed applications
Author :
Talkhan, I.E. ; Abdel-Aty-Zohdy, H.S.
Author_Institution :
Dept. of Electr. & Syst. Eng., Oakland Univ., Rochester, MI, USA
Abstract :
The dynamic operation of various n-channel silicon-on-insulator (SOI) junction field effect transistors (JETs) is presented. A previously developed program, based on an accurate model of the SOI JFET I-V characteristics, taking into account the effect of SOI structure on the charge carrier mobility, is modified to include the calculations of the device parameters and high-speed figures of merit. The authors present the DC, AC, and transient response analysis of inverters with n-channel E-JFET drivers and depletion-type loads. (E/D inverters). Results are simulated for different device parameters and supply voltages for VLSI circuit applications. A fifteen-stage ring oscillator is used to rate the performance of the SOI E/D JFET inverters for future digital logic applications. SOI E/D inverter performance compared favorably with typical GaAs inverter structures
Keywords :
junction gate field effect transistors; logic gates; semiconductor device models; semiconductor-insulator boundaries; transient response; AC response; DC response; I-V characteristics; JFET inverters; JFETs; SOI E/D inverter; SOI structure; Si; VLSI circuit applications; charge carrier mobility; depletion-type loads; digital logic applications; dynamic operation; enhancement; fifteen-stage ring oscillator; high-speed applications; junction field effect transistors; low speed applications; n-channel; nonuniform channel parameters; small signal model; transient response analysis; Charge carrier mobility; Circuit simulation; Driver circuits; FETs; Inverters; JFETs; Silicon on insulator technology; Transient analysis; Transient response; Voltage;
Conference_Titel :
Circuits and Systems, 1991., Proceedings of the 34th Midwest Symposium on
Conference_Location :
Monterey, CA
Print_ISBN :
0-7803-0620-1
DOI :
10.1109/MWSCAS.1991.251989