DocumentCode
3398267
Title
A case study on data fusion with overlapping segments
Author
Cloninger, Alexander ; Czaja, Wojciech ; Doster, Timothy
Author_Institution
Dept. of Math., Univ. of Maryland, College Park, MD, USA
fYear
2013
fDate
23-25 Oct. 2013
Firstpage
1
Lastpage
11
Abstract
With the continual improvement and diversification of existing sensing modalities and the emergence of new sensing technologies, methods to effectively and efficiently fuse the diverse and heterogeneous data sets are increasingly important. When different sensors acquire data over the same region of the Earth, a direct comparison between pixels acquired from one sensor to pixels acquired from a another sensor becomes difficult. For example, there could be different number of bands, or the sensors could measure drastically different spaces (hyperspectral and LIDAR). A solution to this problem is Feature Space Rotation, which realizes the sensor data independently in separate feature spaces via a machine learning algorithm and then a rotation is learned to bring the separate feature spaces into a common feature space. This rotation, in it original form, requires some amount of overlap between the data sets. We propose a study to determine the effect of decreasing the amount of overlap between the two sensors has on the classification accuracy. For this study, we shall rely on hyperspectral data that has been simulated to come from two disjoint sensors.
Keywords
geophysical image processing; hyperspectral imaging; image classification; image fusion; image segmentation; learning (artificial intelligence); optical radar; LIDAR; classification accuracy; common feature space; disjoint sensors; diverse-heterogeneous data set fusion; feature space rotation; hyperspectral data; machine learning algorithm; overlapping segments; sensor data; separate feature spaces; Data integration; Extraterrestrial measurements; Hyperspectral imaging; Laplace equations; Machine learning algorithms; Sensors;
fLanguage
English
Publisher
ieee
Conference_Titel
Applied Imagery Pattern Recognition Workshop (AIPR): Sensing for Control and Augmentation, 2013 IEEE
Conference_Location
Washington, DC
Type
conf
DOI
10.1109/AIPR.2013.6749316
Filename
6749316
Link To Document