Title :
Overview of 3D NAND Flash and progress of vertical gate (VG) architecture
Author :
Hang-Ting Lue ; Shih-Hung Chen ; Yen-Hao Shih ; Kuang-Yeu Hsieh ; Chih-Yuan Lu
Author_Institution :
Macronix Int. Co., Ltd., Hsinchu, Taiwan
fDate :
Oct. 29 2012-Nov. 1 2012
Abstract :
This paper provides an overview of 3D NAND Flash memory architecture and a comprehensive study on various array decoding methods of vertical gate (VG) NAND Flash. A certain memory density may be achieved by any array architecture but with different numbers of stacking layers. A smaller pitch allows the achieving of high density at reasonable number of stacked memory layers (≤ 32) and thus potentially offers lower cost. VG NAND has good pitch scalability thus is very attractive. On the other hand, it is more difficult to decode the bit line in a VG architecture, thus decoding innovations are required for a compact array architecture design. This paper provides a systematic comparison of four different decoding methods of VG NAND. Performance of the TFT BE-SONOS device used in 3D VG NAND is also addressed.
Keywords :
NAND circuits; decoding; flash memories; logic arrays; three-dimensional integrated circuits; 3D NAND flash; TFT BE-SONOS device; array decoding method; memory density; vertical gate NAND; vertical gate architecture; Arrays; Decoding; Flash memory; Logic gates; Microprocessors; Thin film transistors;
Conference_Titel :
Solid-State and Integrated Circuit Technology (ICSICT), 2012 IEEE 11th International Conference on
Conference_Location :
Xi´an
Print_ISBN :
978-1-4673-2474-8
DOI :
10.1109/ICSICT.2012.6466681