• DocumentCode
    3398395
  • Title

    Probabilistic Evaluation to Voltage beyond Limits of Power System Taking Account of Zero Output State of Wind Power Farm

  • Author

    Niu, Huanna ; Yang, Minghao ; Cai, Zhuang

  • Author_Institution
    Coll. of Inf. & Electr. Eng., China Agric. Univ., Beijing, China
  • fYear
    2012
  • fDate
    27-29 March 2012
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    To analyze quantitatively the voltage beyond limits of power system including wind farms, based on the establishment of probabilistic model of wind generation output and load, proposes a model of probabilistic evaluation to voltage beyond limits of power system taking account of zero output state of wind power farm. Considers the state of zero power output of WPG to be an incident, which occurs with a given probabilistic, with computational tools based on probabilistic load flow of cumulant method, calculate the conditional probabilistic to voltage beyond limits of system under a single incident occurred, then obtain the probabilistic to voltage beyond limits of system according to total probability formula. Example of IEEE30 system calculates the probabilistic to voltage beyond limits of system under the zero output states of wind farms at different nodes, analyzes the impact on the probabilistic to voltage beyond limits of system coused by every wind farm by sorting. Simulation results shows that the model and algorithm can provide a reference for the operation department.
  • Keywords
    power engineering computing; probability; wind power; wind power plants; IEEE30 system; operation department; power system; probabilistic evaluation; voltage beyond limits; wind generation output; wind power farm; zero output state; Load flow; Mathematical model; Power system stability; Probabilistic logic; Wind farms; Wind power generation; Wind speed;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power and Energy Engineering Conference (APPEEC), 2012 Asia-Pacific
  • Conference_Location
    Shanghai
  • ISSN
    2157-4839
  • Print_ISBN
    978-1-4577-0545-8
  • Type

    conf

  • DOI
    10.1109/APPEEC.2012.6307616
  • Filename
    6307616