• DocumentCode
    3398467
  • Title

    Modelling of partial discharge activity in different spherical cavity sizes and locations within a dielectric insulation material

  • Author

    Illias, Hazlee A. ; Chen, George ; Lewin, Paul L.

  • Author_Institution
    Electr. Power Eng. Group, Univ. of Southampton, Southampton, UK
  • fYear
    2009
  • fDate
    19-23 July 2009
  • Firstpage
    485
  • Lastpage
    488
  • Abstract
    The pattern of partial discharge (PD) occurrence at a defect site within a solid dielectric material is influenced by the conditions of the defect site. This is because the defect conditions, mainly its size and location determine the electric field distributions at the defect site which influence the patterns of PD occurrence. A model for a spherical cavity within a homogeneous dielectric material has been developed by using Finite Element Analysis (FEA) software. The model is used to study the influence of different conditions of the cavity on the electric field distribution in the cavity and the PD activity. In addition, experimental measurements of PD in spherical cavities of different size within a dielectric material have been undertaken. The obtained results show that PD activity depends on the size of the cavity within the dielectric material.
  • Keywords
    dielectric materials; finite element analysis; insulating materials; partial discharges; dielectric insulation material; electric field distribution; finite element analysis; homogeneous dielectric material; partial discharge; spherical cavity; Detectors; Dielectric materials; Dielectrics and electrical insulation; Electrodes; Finite element methods; Object detection; Partial discharges; Solid modeling; Testing; Voltage; Finite Element Analysis method; Partial discharge; spherical cavity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Properties and Applications of Dielectric Materials, 2009. ICPADM 2009. IEEE 9th International Conference on the
  • Conference_Location
    Harbin
  • Print_ISBN
    978-1-4244-4367-3
  • Electronic_ISBN
    978-1-4244-4368-0
  • Type

    conf

  • DOI
    10.1109/ICPADM.2009.5252384
  • Filename
    5252384