• DocumentCode
    3398616
  • Title

    Application of self organizing map approach for partial discharge pattern recognition of insulators

  • Author

    Chang, Wen-Yeau

  • Author_Institution
    Dept. of Electr. Eng., St. John´´s Univ., Taipei, Taiwan
  • fYear
    2009
  • fDate
    19-23 July 2009
  • Firstpage
    449
  • Lastpage
    452
  • Abstract
    This paper proposes a self organizing map (SOM) based recognition method to identify the insulation defects of electrical apparatus arising from partial discharge (PD). PD patterns are detected by a PD detecting system set up in the laboratory. The significant features of PD patterns are extracted by using the nonlinear principal component analysis (NLPCA) method. Based on the feature extracted, the SOM network is further employed for the PD pattern recognition. To verify the proposed approach, experiments are conducted to demonstrate the field-test PD pattern recognition of insulators by using 250 feature vectors of field-test PD patterns. Five types of models with artificial defects are purposely created to produce five common PD activities of insulators for the experiments. The practical results show that the proposed method is promising as a solution to the PD pattern recognition.
  • Keywords
    feature extraction; insulators; partial discharges; power engineering computing; principal component analysis; self-organising feature maps; electrical apparatus; feature extraction; insulation defect identification; insulators; nonlinear principal component analysis method; partial discharge pattern recognition; selforganizing map approach; Dielectrics and electrical insulation; Feature extraction; Fuzzy systems; Hybrid intelligent systems; Laboratories; Multi-layer neural network; Organizing; Partial discharges; Pattern recognition; Transformers; Insulators; Nonlinear principal component analysis; Partial discharge; Pattern recognition; Self organizing map;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Properties and Applications of Dielectric Materials, 2009. ICPADM 2009. IEEE 9th International Conference on the
  • Conference_Location
    Harbin
  • Print_ISBN
    978-1-4244-4367-3
  • Electronic_ISBN
    978-1-4244-4368-0
  • Type

    conf

  • DOI
    10.1109/ICPADM.2009.5252392
  • Filename
    5252392