DocumentCode :
3398619
Title :
Feature track summary visualization for sequential multi-view reconstruction
Author :
Recker, Shawn ; Hess-Flores, Mauricio ; Joy, Kenneth I.
Author_Institution :
Inst. of Data Anal. & Visualization, Univ. of California Davis, Davis, CA, USA
fYear :
2013
fDate :
23-25 Oct. 2013
Firstpage :
1
Lastpage :
9
Abstract :
Analyzing sources and causes of error in multi-view scene reconstruction is difficult. In the absence of any ground-truth information, reprojection error is the only valid metric to assess error. Unfortunately, inspecting reprojection error values does not allow computer vision researchers to attribute a cause to the error. A visualization technique to analyze errors in sequential multi-view reconstruction is presented. By computing feature track summaries, researchers can easily observe the progression of feature tracks through a set of frames over time. These summaries easily isolate poor feature tracks and allow the observer to infer the cause of a delinquent track. This visualization technique allows computer vision researchers to analyze errors in ways previously unachieved. It allows for a visual performance analysis and comparison between feature trackers, a previously unachieved result in the computer vision literature. This framework also provides the foundation to a number of novel error detection and correction algorithms.
Keywords :
computer vision; data visualisation; error correction; error detection; feature extraction; image reconstruction; object tracking; computer vision literature; computer vision researchers; delinquent track; error correction algorithms; error detection algorithms; feature track summary visualization; feature trackers; ground-truth information; multiview scene reconstruction; reprojection error values; sequential multiview reconstruction; visualization technique; Cameras; Computer vision; Data visualization; Image color analysis; Image reconstruction; Measurement; Visualization;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Applied Imagery Pattern Recognition Workshop (AIPR): Sensing for Control and Augmentation, 2013 IEEE
Conference_Location :
Washington, DC
Type :
conf
DOI :
10.1109/AIPR.2013.6749337
Filename :
6749337
Link To Document :
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