Title :
Physically based description of quasi-saturation region of vertical DMOS power transistors
Author :
Kreuzer, C.H. ; Krischke, N. ; Nance, P.
Author_Institution :
Bundeswehr Univ., Munich, Germany
Abstract :
For short circuit design protection, quasi-saturation behaviour of vertical power DMOS transistors has to be included in circuit simulator compact models. In this region an unexpected increase in current has been observed, due to the injection of electrons from the n/sup +/ source region into the n-substrate. The purpose of this paper is to analyze this effect and include its results in a compact model for circuit simulation.
Keywords :
circuit analysis computing; electric resistance; electron density; power MOSFET; semiconductor device models; voltage distribution; circuit simulation; circuit simulator compact models; drain resistance; electron concentration; electron injection; n-substrate; n/sup +/ source region; physically based description; quasi-saturation region; short circuit design protection; vertical DMOS power transistors; voltage distribution; Analytical models; Circuit simulation; Contact resistance; Doping; Electric resistance; Electron mobility; Immune system; Medical simulation; Power transistors; Voltage;
Conference_Titel :
Electron Devices Meeting, 1996. IEDM '96., International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-3393-4
DOI :
10.1109/IEDM.1996.553844