Title :
Recent developments in ESD protection for RF ICs
Author_Institution :
Dept. of Electr. & Comput. Eng., Illinois Inst. of Technol., Chicago, IL, USA
Abstract :
New challenge in ESD protection design for RF ICs is to address the complex interactions between the ESD protection network and the core circuit being protected in both directions. This paper reviews recent developments in RF ESD protection design, including switching and mis-triggering of ESD protection networks; ESD-induced parasitic capacitive, resistive, noise coupling and self-generated noise effects, RF ESD evaluation techniques; and low-parasitic compact RF ESD protection solutions.
Keywords :
electrostatic discharge; integrated circuit design; integrated circuit noise; integrated circuit reliability; protection; radiofrequency integrated circuits; reviews; ESD protection design; ESD protection network; ESD-induced parasitic capacitive noise coupling; ESD-induced parasitic resistive noise coupling; RF ESD evaluation techniques; RF IC; core circuit interactions; low-parasitic compact RF ESD protection; mis-triggering; self-generated noise effects; switching; Circuit optimization; Circuit synthesis; Electrostatic discharge; High speed integrated circuits; Integrated circuit noise; Protection; Radio frequency; Radiofrequency integrated circuits; Switches; Variable structure systems;
Conference_Titel :
Design Automation Conference, 2003. Proceedings of the ASP-DAC 2003. Asia and South Pacific
Print_ISBN :
0-7803-7659-5
DOI :
10.1109/ASPDAC.2003.1195012
