• DocumentCode
    3398884
  • Title

    Research on aging characteristics of twisted pair based on dielectric loss under high frequency pulse voltage

  • Author

    Gao, Bo ; Wu, Guangning ; Zhou, Liren ; Cao, Kaijiang ; Luo, Yang

  • Author_Institution
    Sch. of Electr. Eng., Southwest Jiaotong Univ., Chengdu, China
  • fYear
    2009
  • fDate
    19-23 July 2009
  • Firstpage
    392
  • Lastpage
    395
  • Abstract
    This paper conducted experiment research on enameled wire used in inter-turn insulation of JD117 inverter-fed motor and focused on twisted pairs as test object. Bipolar pulse voltage aging test was conducted under various frequency and time; dielectric frequency and temperature spectra of specimen were measured and analyzed; combining with Scanning Electrical Microscope (SEM), the influence of different aging conditions on surface morphology were researched. The experiment results reveal that with the aging degree deepening, through analyzing frequency spectrum of tan delta, its peak value can be used to judge the insulation condition. There exists significant difference of surface morphology of twisted pair between non-aging and aging. That difference becomes increasingly evident with the deepening of aging degree.
  • Keywords
    ageing; dielectric losses; twisted pair cables; aging characteristics; aging degree; bipolar pulse voltage aging test; dielectric frequency; dielectric loss; enameled wire; frequency spectrum; high frequency pulse voltage; scanning electrical microscope; surface morphology; twisted pair; Aging; Cable insulation; Dielectric losses; Dielectrics and electrical insulation; Frequency; Pulse measurements; Scanning electron microscopy; Surface morphology; Voltage; Wire; Inverter-fed motor; aging; dielectric loss; dielectric spectrum; twisted pair;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Properties and Applications of Dielectric Materials, 2009. ICPADM 2009. IEEE 9th International Conference on the
  • Conference_Location
    Harbin
  • Print_ISBN
    978-1-4244-4367-3
  • Electronic_ISBN
    978-1-4244-4368-0
  • Type

    conf

  • DOI
    10.1109/ICPADM.2009.5252407
  • Filename
    5252407