Title :
Low-frequency dispersion of ZnO/Bi2O3 ceramics analyzing by universal power law
Author :
Min, Daomin ; Li, Shengtao ; Zhou, Zhangbin ; Yin, Guilai ; Li, Jianying
Author_Institution :
State Key Lab. of Electr. Insulation & Power Equip., Xi´´an Jiaotong Univ., Xi´´an, China
Abstract :
Recently, universal power law becomes widely used. In this paper, it was used to study the ZnO/Bi2O3 ceramics. Bi2O3 is the only additive of ZnO here in order to directly study the effect of Bi2O3 in ZnO. ZnO samples with different content of Bi2O3 were made by the traditional ceramic technique. Then the microstructure of the acid erosion surface was observed by polarized optical microscope, the dielectric properties of the samples, such as conductivity, permittivity and dielectric loss, were tested by Novocontrol Broadband-Frequency Dielectric Temperature Measuring Instrument, and the activation energy was calculated by Arrhenius relation. A strong Anomalous low-frequency dispersion phenomenon was found while investigating the dielectric properties of ZnO/Bi2O3 ceramics. The experimental results of the dielectric properties which are in the frequency range of 0.1 Hz ~ 107 Hz and the temperature range of 173 K ~ 473 K were systematically analyzed by universal power law. The results show that the conductivity loss is the main factor in the low frequency, while the dielectric loss is dominant in the high frequency. The higher the temperature, the more similarity of the AC I-V characteristic to the DC ones, which means that omegae can token the thermally simulated degree of electrons to the temperature, since the conductivity of the samples was generated mostly by thermally simulated electrons. The density ratio of zinc interstitials and oxygen vacancies decreased with the increase of Bi2O3 content fewer than 5 wt%, and then it will be oxygen vacancies from 5 wt % Bi2O3 content to 15 wt% that dominated the dielectric properties.
Keywords :
ceramics; crystal microstructure; dielectric losses; dielectric materials; electrical conductivity; permittivity; Arrhenius relation; Novocontrol Broadband-Frequency Dielectric Temperature Measuring Instrument; ZnO-Bi2O3; acid erosion surface; ceramics; conductivity; density ratio; dielectric loss; dielectric properties; low-frequency dispersion; microstructure; oxygen vacancies; permittivity; polarized optical microscope; universal power law; Bismuth; Ceramics; Dielectric loss measurement; Dielectric losses; Electrons; Frequency; Optical microscopy; Temperature; Thermal conductivity; Zinc oxide; Dielectric property; Low-frequency dispersion; Universal power law; ZnO;
Conference_Titel :
Properties and Applications of Dielectric Materials, 2009. ICPADM 2009. IEEE 9th International Conference on the
Conference_Location :
Harbin
Print_ISBN :
978-1-4244-4367-3
Electronic_ISBN :
978-1-4244-4368-0
DOI :
10.1109/ICPADM.2009.5252414